The new Institute for Critical Technology and Applied Science (ICTAS) will attract top faculty and students, foster collaboration between researchers, increase research funding, and provide infrastructure and space to facilitate these aims. The ICTAS Initiative at Virginia Tech (led by the College of Engineering) will involve the construction of several new buildings comprising a multi-disciplinary research laboratory and a 15,000 ft2 state-of-the-art Advanced Materials Characterization Facility (AMCF). The AMCF facility will be formed by a collection of new and existing tools for processing, characterizing, and testing materials at the macro, micro, and nanometer scales. Of the expected cost of $12M in equipment for the AMCF, the University has already provided $3.2M to purchase a High-Resolution Transmission Electron Microscope (HRTEM) and an ion microprobe. The equipment to be housed in the AMCF includes:

Electron Microscopes

Scanning Electron Microscope


Environmental Scanning Electron Microscope

Secondary Ion Mass Spectroscope

Nano-Indenter, Nano-Structure Manipulator, and Nano-Lithography Systems

Ferromagnetic/Ferroelectric Properties Measurement Systems

Ion Miller

Focused Ion Beam

Optical Microscopes

Atomic Force Microscopes

Nano-Manipulation Capabilities

X-ray Diffractometers

X-ray Tomograph

X-ray Photoelectron Spectrometer

Zeta Potentiometer

Clean Room Facility

Plasma Etching, Film Deposition

Mask Aligners, Film Thickness Tester

Wet Benches, Spin Casters

Annealing/Doping Furnaces

Thermal Analysis

Differential Thermal Analyzer

Differential Scanning Calorimeter

Thermogravimetric Analyzer

Dynamic Mechanical Analysis Dilatometer

Plasma Spray


Ultraviolet-Visible-Near Infrared

Fourier Transform Infrared

Dielectric Properties Measurement System

Nuclear Magnetic Resonance


Particle Size Analyzer

Surface Area/Pore Analyzer

Laser Ablation System


Fluid Energy Mill

Rapid Prototyping Instrument

Metallorganic Chemical Vapor Deposition Facility

MOCVD Hot Wall Reactor

Wet Benches

Sample Testing